IEEE - Institute of Electrical and Electronics Engineers, Inc. - Efficient statistical BJT modeling, why /spl beta/ is more than I/sub c//I/sub b/

Proceedings of the 1997 Bipolar/BiCMOS Circuits and Technology Meeting

Author(s): McAndrew, C.C. ; Bates, J. ; Ida, R.T. ; Drennan, P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Minneapolis, MN, USA
Conference Date: 28 September 1997
Page(s): 28 - 31
ISBN (Paper): 0-7803-3916-9
ISSN (Paper): 1088-9299
DOI: 10.1109/BIPOL.1997.647349
Regular:

This paper presents a new, efficient, accurate method for statistical BJT modeling, using backward propagation of variance (BPV). The method uses process control (PC) data to infer variations in... View More

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