IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test and diagnosis of faulty logic blocks in FPGAs

Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)

Author(s): Sying-Jyan Wang ; Tsi-Ming Tsai
Sponsor(s): IEEE Circuits & Syst. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: San Jose, CA, USA, USA
Conference Date: 9 November 1997
Page Count: 6
Page(s): 722 - 727
ISBN (Paper): 0-8186-8200-0
ISSN (Paper): 1092-3152
DOI: 10.1109/ICCAD.1997.643618
Regular:

Since field programmable gate arrays (FPGAs) are reprogrammable, faults in them can be easily tolerated once fault sites are located. We present a method for the testing and diagnosis of faults in... View More

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