IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fast identification of untestable delay faults using implications

Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)

Author(s): Heragu, K. ; Patel, J.H. ; Agrawal, V.D.
Sponsor(s): IEEE Circuits & Syst. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: San Jose, CA, USA, USA
Conference Date: 9 November 1997
Page Count: 6
Page(s): 642 - 647
ISBN (Paper): 0-8186-8200-0
ISSN (Paper): 1092-3152
DOI: 10.1109/ICCAD.1997.643606
Regular:

The authors propose a novel algorithm to rapidly identify untestable delay faults using pre-computed static logic implications. The fault-independent analysis identifies large sets of untestable... View More

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