IEEE - Institute of Electrical and Electronics Engineers, Inc. - A neural network approach to structure damage assessment

Proceedings Intelligent Information Systems. IIS'97

Author(s): Faravelli, L. ; Pisano, A.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Grand Bahama Island, Bahamas, Bahamas
Conference Date: 8 December 1997
Page(s): 585 - 588
ISBN (Paper): 0-8186-8218-3
DOI: 10.1109/IIS.1997.645426
Regular:

Presents a method for damage detection in multi-bay planar truss structures. A neural network is trained by transfer functions of the structural system. The approach allows one to avoid all the... View More

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