IEEE - Institute of Electrical and Electronics Engineers, Inc. - An extended march test algorithm for embedded memories

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Gang-Min Park ; Hoon Chang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 404 - 409
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643990
Regular:

In this paper, an efficient test algorithm and BIST architecture for embedded memories are presented. The proposed test algorithm can fully detect stuck-at fault, transition fault, coupling fault.... View More

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