IEEE - Institute of Electrical and Electronics Engineers, Inc. - Built-in self-test for multi-port RAMs

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Yuejian Wu ; Gupta, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 398 - 403
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643989
Regular:

Most multi-port memory BIST algorithms treat the memory as multiple individual single-port memories and test each independently using the algorithms developed for single-port RAMs. A major problem... View More

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