IEEE - Institute of Electrical and Electronics Engineers, Inc. - I/sub DDT/ testing

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Yinghua Min ; Zhuxing Zhao ; Zhongcheng Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 378 - 383
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643986
Regular:

The industry has accepted I/sub DDQ/ testing to detect CMOS IC defects. While I/sub DDT/ testing needs more research to be applicable in practice. However, it is noticed that observing the average... View More

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