IEEE - Institute of Electrical and Electronics Engineers, Inc. - Supply current test for unit-to-unit variations of electrical characteristics in gates

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Hashizume, M. ; Kuchii, T. ; Tamesada, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 372 - 377
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643985
Regular:

A practical supply current test method is proposed and the experimental evaluation results are presented. In the method, the unit-to-unit variation of electrical characteristics in each logic gate... View More

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