IEEE - Institute of Electrical and Electronics Engineers, Inc. - Power supply current monitoring techniques for testing PLLs

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Dalmia, M. ; Ivanov, A. ; Tabatabaei, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 366 - 371
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643984
Regular:

The effectiveness of current testing for digital IC's has led researchers to explore the possibility of extending this concept to testing analog blocks of mixed-signal ICs. Unfortunately, test... View More

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