IEEE - Institute of Electrical and Electronics Engineers, Inc. - Random pattern testable design with partial circuit duplication

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Yokoyama, H. ; Xiaoqing Wen ; Tamatoto, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 353 - 358
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643982
Regular:

The advantage of random testing is that test application can be performed at a low cost in the BIST scheme. However, not all circuits are random pattern testable. In this paper, we present a... View More

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