IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the capability of delay tests to detect bridges and opens

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Chakravarty, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 314 - 319
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643976
Regular:

Recent empirical and simulation studies show that adding at-speed testing to the test suite helps in detecting defective ICs missed by slow-speed and I/sub DDQ/ testing. At-speed testing attempts... View More

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