IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault diagnosis of odd-even sorting networks

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Chih Wei Hu ; Chung Len Lee ; Wen Ching Wu ; Chen, J.E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 288 - 293
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643972
Regular:

This paper investigates detection and location for single faults in odd-even sorting networks. In the work, we have found that three tests are enough to locate single link fault and four tests are... View More

Advertisement