IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault diagnosis for static CMOS circuits

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Wen Xiaoqing ; Tamamoto, H. ; Saluja, K.K. ; Kinoshita, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 282 - 287
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643971
Regular:

This paper presents a new methodology for transistor leakage fault diagnosis using both I/sub DDQ/ and logic information. A method for handling intermediate faulty voltages in fault simulation is... View More

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