IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the complexity of universal fault diagnosis for look-up table FPGAs

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Inoue, T. ; Miyazaki, S. ; Fujiwara, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 276 - 281
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643970
Regular:

In this paper, we introduce universal fault diagnosis such that when applied to an unprogrammed FPGA, it locates a fault in any faulty programmed FPGA corresponding to the unprogrammed FPGA. If a... View More

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