IEEE - Institute of Electrical and Electronics Engineers, Inc. - A XOR-tree based technique for constant testability of configurable FPGAs

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Huang, W.K. ; Zhang, M.Y. ; Meyer, F.J. ; Lombardi, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 248 - 253
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643966
Regular:

This paper presents a novel approach for testing and diagnosing configurable field programmable gate arrays (FPGAs). The proposed approach is row-based and uses a two-session procedure. The... View More

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