IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analog signal metrology for mixed signal ICs

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Chauchin Su ; Yi-Ren Cheng ; Yue-Tsang Chen ; Shing Tenchen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 194 - 199
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643958
Regular:

Signal reconstruction reconstructs a multiple period low-rate sampled waveform into a one-period high-rate sampled waveform. With which, we are able to provide sufficient samples of analog signals... View More

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