IEEE - Institute of Electrical and Electronics Engineers, Inc. - A perturbation based fault modeling and simulation for mixed-signal circuits

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Ben-Hamida, N. ; Saab, K. ; Marche, D. ; Kaminska, B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 182 - 187
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643956
Regular:

The areas of analog circuit fault simulation and test generation have not witnessed the same degree of success as their digital counterparts. This is due mainly to the complexity of analog... View More

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