IEEE - Institute of Electrical and Electronics Engineers, Inc. - Guided-probe diagnosis of macro-cell-designed LSI circuits

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Kuji, N.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 174 - 179
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643955
Regular:

A novel guided-probe diagnostic method for macro cells has been developed. Since macro cells have no netlist corresponding to layout, CAD-navigation data and the logic-simulation netlist are... View More

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