IEEE - Institute of Electrical and Electronics Engineers, Inc. - An approach to diagnose logical faults in partially observable sequential circuits

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Yamazaki, K. ; Yamada, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 168 - 173
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643954
Regular:

We propose an approach for locating logical faults in sequential circuits under the condition that all the internal nets are not observable. In this approach, candidates for the error sources are... View More

Advertisement