IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic EB fault tracing system by successive circuit extraction from VLSI CAD layout data

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Miura, K. ; Nakata, K. ; Nakamae, K. ; Fujioka, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 162 - 167
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643953
Regular:

An automatic electron beam (EB) fault tracing system is described which enables us to trace faults automatically from the top level cell to the lowest primitive cell and from the primitive cell to... View More

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