IEEE - Institute of Electrical and Electronics Engineers, Inc. - Computing stress tests for interconnect defects

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Dabholkar, V. ; Chakravarty, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 143 - 148
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643950
Regular:

Reliability screens are used to reduce infant mortality. The quality of the stress test set used during. The screening process has a direct bearing on the effectiveness of the screen. We have... View More

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