IEEE - Institute of Electrical and Electronics Engineers, Inc. - On energy efficiency of VLSI testing

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Cheng-Wen Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 132 - 137
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643948
Regular:

We discuss the role of power and energy in computation and test efficiency. This is done by the proposal of new computation and test efficiency models that take energy into consideration, followed... View More

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