IEEE - Institute of Electrical and Electronics Engineers, Inc. - Integrated and automated design-for-testability implementation for cell-based ICs

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Ono, T. ; Wakui, K. ; Hikima, H. ; Nakamura, Y. ; Yoshida, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 122 - 125
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643946
Regular:

This paper presents several design-for-testability (DFT) techniques for cell-based ICs. In the design of cell-based ICs, embedded cores are often used along with the user defined random... View More

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