IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testability features of R10000 microprocessor

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Mori, J. ; Mathew, B. ; Burns, D. ; Mok, Y.-H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 108 - 111
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643930
Regular:

This paper describes the testability design features of the R10000 microprocessor. It has specific testability features for debug and manufacturing purposes. Observability registers are... View More

Advertisement