IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design and implementation of strongly code disjoint CMOS built-in intermediate voltage sensor for totally self-checking circuits

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Pang, J.C.W. ; Wong, M.W.T. ; Lee, Y.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 82 - 87
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643925
Regular:

This paper presents a new approach to implement a strongly code-disjoint CMOS built-in intermediate voltage sensor(BIVS). The function of the BIVS is used to detect any intermediate voltage caused... View More

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