IEEE - Institute of Electrical and Electronics Engineers, Inc. - Exploiting logic simulation to improve simulation-based sequential ATPG

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Corno, F. ; Prinetto, P. ; Rebaudengo, M. ; Reorda, M.S. ; Violante, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 68 - 73
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643922
Regular:

The constantly increasing circuit size makes the sequential ATPG problem a challenging area even when simulation-based algorithms are exploited. Several techniques have been proposed which mainly... View More

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