IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design of C-testable multipliers based on the modified Booth Algorithm

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Boateng, K.O. ; Takabashi, H. ; Takamatsu, Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 42 - 47
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643914
Regular:

In this paper, we consider the design for testability of multipliers based on the modified Booth Algorithm. We introduce two basic array implementations of the multiplier and present a strategy to... View More

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