IEEE - Institute of Electrical and Electronics Engineers, Inc. - An algorithmic test generation method for crosstalk faults in synchronous sequential circuits

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Itazaki, N. ; Matsumoto, Y. ; Kinoshita, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 22 - 27
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643909
Regular:

As VLSI circuits become high-speed and high-density, a crosstalk fault becomes an important problem. In a synchronous sequential circuit, since the crosstalk fault between a data line and a clock... View More

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