IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the adders with minimum tests

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Kajihara, S. ; Sasao, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
Page(s): 10 - 15
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643907
Regular:

This paper considers two types of n-bit adders, ripple carry adders and cascaded carry look-ahead adders, with minimum tests for stuck-at-fault models. In the first part, we present two types of... View More

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