IEEE - Institute of Electrical and Electronics Engineers, Inc. - Embedded test and measurement critical for deep submicron technology

Proceedings Sixth Asian Test Symposium (ATS'97)

Author(s): Agarwal, V.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Akita, Japan, Japan
Conference Date: 17 November 1997
ISBN (Paper): 0-8186-8209-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.1997.643905
Regular:

The embedded test and measurement (ETM) technology has been known in the past by its various other names such as Built-In Test Equipment (BITE), Built-In Test (BIT), Built-In Self-Test (BIST), and... View More

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