IEEE - Institute of Electrical and Electronics Engineers, Inc. - Latch-up at RAM control circuitry

Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits

Author(s): Chua Yong Chiang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Singapore
Conference Date: 25 July 1997
Page(s): 250 - 253
ISBN (Paper): 0-7803-3985-1
DOI: 10.1109/IPFA.1997.638329
Regular:

Typically, latch-up is associated with higher input voltage at port pins as compared to power pins, Vcc, causing damage to the protection circuitry or input buffer circuitry. However, for one of... View More

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