IEEE - Institute of Electrical and Electronics Engineers, Inc. - Investigation of failure mechanisms in power VDMOSFETs

Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits

Author(s): Tosic, N. ; Pesic, B. ; Stojadinovic, N.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Singapore
Conference Date: 25 July 1997
Page(s): 191 - 195
ISBN (Paper): 0-7803-3985-1
DOI: 10.1109/IPFA.1997.638198
Regular:

The specific application of power devices has imposed the requirement for intensive investigation of their reliability. In this paper we have investigated failure mechanisms in power VDMOSFETs... View More

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