IEEE - Institute of Electrical and Electronics Engineers, Inc. - Signature analysis based IC diagnostics-a statistician's perspective

Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits

Author(s): Lakshminarayan, C.K. ; Pabbisetty, S. ; Chien-Pai Han
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Singapore
Conference Date: 25 July 1997
Page(s): 167 - 171
ISBN (Paper): 0-7803-3985-1
DOI: 10.1109/IPFA.1997.638191
Regular:

This paper deals with the basic concepts of signature analysis, and will attempt to demonstrate how its implementation would enable efficient utilization of failure analysis engineering resources... View More

Advertisement