IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault coverage estimation model for partially testable multichip modules

Proceedings Pacific Rim International Symposium on Fault-Tolerant Systems

Author(s): Wang-Dauh Tseng ; Kuochen Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Taipei, Taiwan, Taiwan
Conference Date: 15 December 1997
Page(s): 72 - 77
ISBN (Paper): 0-8186-8212-4
DOI: 10.1109/PRFTS.1997.640128
Regular:

This paper proposes a simple and efficient model for designers to estimate fault coverage for partially testable MCMs. This model relates fault coverage, test methodology, and the ratio and... View More

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