IEEE - Institute of Electrical and Electronics Engineers, Inc. - Thermal cycling induced wiping wear of connector contacts at 150/spl deg/C

Electrical Contacts - 1997 Proceedings of the Forty-Third IEEE Holm Conference on Electrical Contacts

Author(s): Leung, C.H. ; Lee, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Philadelphia, PA, USA, USA
Conference Date: 20 October 1997
Page(s): 132 - 137
ISBN (Paper): 0-7803-3968-1
DOI: 10.1109/HOLM.1997.638005
Regular:

Experiments were performed to study the contact resistance changes of several common connector contact materials (0.2%Co hard gold plate, Diffuse Gold Alloy (DGR-156), tin plated copper alloy and... View More

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