IEEE - Institute of Electrical and Electronics Engineers, Inc. - Back communication in low voltage interrupters: influence of recovery time, geometry and materials of contacts and walls

Electrical Contacts - 1997 Proceedings of the Forty-Third IEEE Holm Conference on Electrical Contacts

Author(s): Gauster, E. ; Rieder, W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Philadelphia, PA, USA, USA
Conference Date: 20 October 1997
Page(s): 91 - 96
ISBN (Paper): 0-7803-3968-1
DOI: 10.1109/HOLM.1997.638000
Regular:

Arc commutation from the arc chute back into the contact gap of a low voltage circuit-breaker caused by a high arc voltage pulse due to arc splitting was investigated in a model interrupter with... View More

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