IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study of analog type frequency-temperature characteristics measurement method for activity dips based on DLD jump

Proceedings of International Frequency Control Symposium

Author(s): Koyama, M. ; Uchida, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Orlando, FL, USA
Conference Date: 30 May 1997
Page(s): 682 - 686
ISBN (Paper): 0-7803-3728-X
DOI: 10.1109/FREQ.1997.638760
Regular:

This paper describes relationship between activity dips and DLD of crystal resonator. The analog type measurement system of frequency-temperature characteristics for crystal resonator is... View More

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