IEEE - Institute of Electrical and Electronics Engineers, Inc. - A typical defect in the Bridgman-grown LBO crystals

Proceedings of International Frequency Control Symposium

Author(s): Shi-Ji Fan ; Ren-Ying Sun ; Jia-Yue Xu ; Guang-Yu Zhang ; Ya-Fang Lin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Orlando, FL, USA
Conference Date: 30 May 1997
Page(s): 536 - 539
ISBN (Paper): 0-7803-3728-X
DOI: 10.1109/FREQ.1997.638655
Regular:

A typical macro-defect, a veil-like layer in the Bridgman-grown <110> LBO crystals, was discovered. The veil-like layer seems to be a semi-transparent veil which covers the whole or partial... View More

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