IEEE - Institute of Electrical and Electronics Engineers, Inc. - A method to measure EMI due to electric field coupling on PCB

Proceedings of Power Conversion Conference - PCC '97

Author(s): Pong, B.M.H. ; Lee, A.C.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Nagaoka, Japan, Japan
Conference Date: 6 August 1997
Volume: 2
ISBN (Paper): 0-7803-3823-5
DOI: 10.1109/PCCON.1997.638393
Regular:

A new method to measure electric field coupling between PCB copper traces is presented. This method enables measurement of noise from waveforms obtainable from breadboard prototypes, which is... View More

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