IEEE - Institute of Electrical and Electronics Engineers, Inc. - On-line testing for VLSI

Proceedings International Test Conference 1997

Author(s): Nicolaidis, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639731
Regular:

A large variety of on-line testing techniques for VLSI was developed in the past and are still enriched by new developments. They can respond efficiently to the increasing complexity of VLSI... View More

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