IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test access of TAP'ed and non-TAP'ed cores

Proceedings International Test Conference 1997

Author(s): Whetsel, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639730
Regular:

Core reuse is an emerging IC design style which enables rapid development of highly complex ICs. Reusable circuit cores come in two basic varieties, hard and soft. Hard cores are optimized for... View More

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