IEEE - Institute of Electrical and Electronics Engineers, Inc. - Embedded core test plug-n-play: is it achievable?

Proceedings International Test Conference 1997

Author(s): Garcia, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639729
Regular:

The testing of embedded cores (or Virtual Components (VCs), as the VSI Alliance calls them) in an environment where the system-chip is composed of multiple cores from different authors, requires... View More

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