IEEE - Institute of Electrical and Electronics Engineers, Inc. - Why automate optical inspection?

Proceedings International Test Conference 1997

Author(s): Raymond, D.W. ; Haigh, D.F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639723
Regular:

It is suggested that automated optical inspection (AOI) competes effectively to fill the in-circuit test gap. AOI adds no unwelcome technologies to the workplace. Its programming and its results... View More

Advertisement