IEEE - Institute of Electrical and Electronics Engineers, Inc. - Why would an ASIC foundry accept anything less than full scan?

Proceedings International Test Conference 1997

Author(s): Oakland, S.F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639721
Regular:

A key force behind IBM's growth in the application-specific integrated circuit (ASIC) market is the ability to sign off on multi-million-gate designs without requiring test vectors,... View More

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