IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effective path selection for delay fault testing of sequential circuits

Proceedings International Test Conference 1997

Author(s): Chakraborty, T.J. ; Agrawal, V.D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 998 - 1,003
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639716
Regular:

This paper outlines several problems related to the delay fault testing of sequential circuits. For timing test of a circuit and for layout optimization, critical path data are needed. When... View More

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