IEEE - Institute of Electrical and Electronics Engineers, Inc. - Efficient identification of non-robustly untestable path delay faults

Proceedings International Test Conference 1997

Author(s): Zhongcheng Li ; Yinghua Min ; Brayton, R.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 992 - 997
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639715
Regular:

This paper presents an efficient implication-based approach for identifying non-robustly untestable path delay faults. It starts from possible conflicts to find untestable faults by performing... View More

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