IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analyzing a PowerPC/sup TM/ 620 microprocessor silicon failure using model checking

Proceedings International Test Conference 1997

Author(s): Raimi, R. ; Lear, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 964 - 973
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639712
Regular:

When silicon is available, newly designed microprocessors ore tested in specially equipped hardware laboratories, where real applications can be run at hardware speeds. However, the large volumes... View More

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