IEEE - Institute of Electrical and Electronics Engineers, Inc. - Embedded at-speed test probe

Proceedings International Test Conference 1997

Author(s): Aigner, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 932 - 937
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639708
Regular:

The addition of a small analog probe circuit to an ASIC design allows previously unreachable internal signal nodes of the ASIC to be accurately monitored and measured with conventional test... View More

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