IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault macromodeling for analog/mixed-signal circuits

Proceedings International Test Conference 1997

Author(s): Chen-Yang Pan ; Kwang-Ting Cheng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 913 - 922
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639706
Regular:

In this paper we propose an efficient fault macromodeling technique for analog/mixed-signal circuits. We formulate the fault macromodeling problem as a problem of deriving the macro parameter set... View More

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