IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault diagnosis in scan-based BIST

Proceedings International Test Conference 1997

Author(s): Rajski, J. ; Tyszer, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 894 - 902
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639704
Regular:

The paper presents a new fault diagnosis technique for scan-based BIST designs. It can be used for non-adaptive identification of the scan cells that are driven by erroneous signals, irrespective... View More

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